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| SN74GTLP22033DGVR资料 | |
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SN74GTLP22033DGVR PDF Download |
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File Size : 116 KB
Manufacturer:TI Description:All MAX® II devices provide Joint Test Action Group (JTAG) boundary- scan test (BST) circuitry that complies with the IEEE Std. 1149.1-2001 specification. JTAG boundary-scan testing can only be performed at any time after VCCINT and all VCCIO banks have been fully powered and a tCONFIG amount of time has passed. MAX II devices can also use the JTAG port for in-system programming together with either the Quartus® II software or hardware using Programming Object Files (.pof), JamTM Standard Test and Programming Language (STAPL) Files (.jam) or Jam Byte-Code Files (.jbc). |
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| 1PCS | 100PCS | 1K | 10K | ||
| 价 格 | |||||
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型 号：SN74GTLP22033DGVR 厂 家：TI 封 装： 批 号：07+ 数 量：14603 说 明：原装正品 |
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运 费：所有运费均有我司承担 所在地：深圳 新旧程度： |
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| 联系人：申小姐 |
| 电 话：0755-83330991,0755-83047629 |
| 手 机：15811820920 |
| QQ：2355514181 |
| MSN：chipstech-int@hotmail.com |
| 传 真：0755-61658118 |
| EMail：sales@chipstech-int.com |
| 公司地址： 深圳市福田区中航路鼎城国际1017 |
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1. 所有我司提供的货物，均为原厂原装正品！ 2. 我们的报价是不含税价格。含税需要增加相应的税点。
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