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| SN74LVCR2245ADBQR资料 | |
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SN74LVCR2245ADBQR PDF Download |
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File Size : 116 KB
Manufacturer:TI Description:Boundary scan instructions and associated data registers support a standard methodology for accessing and config- uring Virtex-II devices that complies with IEEE standards 1149.1 - 1993 and 1532. A system mode and a test mode are implemented. In system mode, a Virtex-II device per- forms its intended mission even while executing non-test boundary-scan instructions. In test mode, boundary-scan test instructions control the I/O pins for testing purposes. The Virtex-II Test Access Port (TAP) supports BYPASS, PRELOAD, SAMPLE, IDCODE, and USERCODE non-test instructions. The EXTEST, INTEST, and HIGHZ test instruc- tions are also supported. |
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| ◆ 44441-2002 | |
| 1PCS | 100PCS | 1K | 10K | ||
| 价 格 | |||||
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型 号：SN74LVCR2245ADBQR 厂 家：TI 封 装： 批 号：07+ 数 量：24294 说 明：原装正品 |
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运 费：所有运费均有我司承担 所在地：深圳 新旧程度： |
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1. 所有我司提供的货物，均为原厂原装正品！ 2. 我们的报价是不含税价格。含税需要增加相应的税点。
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