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TLV2621IDBVTG4资料 | |
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TLV2621IDBVTG4 PDF Download |
File Size : 116 KB
Manufacturer:TI Description:Notes: 1. Standard Deviation and Typical Data based at least 450 part sample size from 9 wafers. Future wafers allocated to this product may have nominal values anywhere within the upper and lower spec limits. 2. Measurements made on a fixed tuned production test circuit (Figure 4) that represents a trade-off between optimal noise match, maximum gain match, and a realizable match based on production test board requirements at 10 mA bias current. Excess circuit losses have been de-embedded from actual measurements. Vd=Vds-Vref where Vds is adjusted to maintain a constant Vd bias equivalent to a single supply 3V bias application. Consult Applications Note for circuit biasing options. 3. Minimum Noise Figure and Associated Gain data computed from s-parameter and noise parameter data measured in a 50Ω system using ATN NP5 test system. Data based on 10 typical parts from 9 wafers. Associated Gain is the gain when the product input is matched for minimum Noise Figure. 4. P1dB measurements were performed in the evaluation circuit with source resistance biasing. As P1dB is approached, the drain current is maintained near the quiescent value by the feedback effect of the source resistor in the evaluation circuit. Consult Applications Note for circuit biasing options. 5. Measurements made on a fixed tuned production test circuit that represents a trade-off between optimal noise match, maximum gain match, and a realizable match based on production test board requirements at 10 mA bias current. Performance may be optimized for different bias conditions and applications. Consult Applications Note. |
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1PCS | 100PCS | 1K | 10K | ||
价 格 | |||||
型 号:TLV2621IDBVTG4 厂 家:TI 封 装: 批 号:07+ 数 量:7075 说 明:原装正品 |
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运 费:所有运费均有我司承担 所在地:深圳 新旧程度: |
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